2026-06-24T21:32:24Zhttps://www.radar-service.eu/oai/OAIHandler10.35097/1jksrn62b09yhxem2026-02-10T09:43:03Zradar4kit
10.35097/1jksrn62b09yhxem
Muench, Marcel
Marcel
Muench
Institut für Angewandte Materialien – Werkstoffkunde (IAM-WK), Karlsruher Institut für Technologie (KIT)
Gholizadeh, Reza
Reza
Gholizadeh
Tsuji, Nobuhiro
Nobuhiro
Tsuji
Peterlechner, Martin
Martin
Peterlechner
Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT)
Eggeler, Yolita M.
Yolita M.
Eggeler
0000-0003-3645-0209
Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT)
Riedel, Jan L.
Jan L.
Riedel
Institut für Angewandte Materialien – Werkstoffkunde (IAM-WK), Karlsruher Institut für Technologie (KIT)
Eusterholz, Michael K.
Michael K.
Eusterholz
0000-0002-5498-0863
Institut für Angewandte Materialien – Werkstoffkunde (IAM-WK), Karlsruher Institut für Technologie (KIT), Karlsruhe Nano Micro Facility (KNMF), Karlsruher Institut für Technologie (KIT)
Heilmaier, Martin
Martin
Heilmaier
Institut für Angewandte Materialien – Werkstoffkunde (IAM-WK), Karlsruher Institut für Technologie (KIT)
Kauffmann, Alexander
Alexander
Kauffmann
0000-0003-0059-3232
Institut für Angewandte Materialien – Werkstoffkunde (IAM-WK), Karlsruher Institut für Technologie (KIT)
Data from "Assessment of the compositional requirements to form Fe-Mn-C austenite-martensite composites"
Karlsruhe Institute of Technology
2025
2025
Naturwissenschaften, Allgemeine
2025-034 03233
APT
FIB
Open Access
Creative Commons Attribution Share Alike 4.0 International
Muench, Marcel
Gholizadeh, Reza
Tsuji, Nobuhiro
Peterlechner, Martin
Eggeler, Yolita M.
0000-0003-3645-0209
Riedel, Jan L.
Eusterholz, Michael K.
0000-0002-5498-0863
Heilmaier, Martin
Kauffmann, Alexander
0000-0003-0059-3232
P3 = Fe-3.0Mn-3.0C (at.%), Fe-3.0Mn-0.7C (wt.%)
P7 = Fe-6.9Mn-3.2C (at.%) Fe-7.0Mn-0.7C (wt.%)
Fig. 3a: Scanning electron microscopy micrograph P3 (pearlite condition, 600 °C/16 h)
Fig. 3b: Scanning electron microscopy micrograph P7 (pearlite condition, 540 °C/96 h)
Fig. 4a: Transmission electron microscopy micrograph, bright field P3 (pearlite condition, 600 °C/16 h)
Fig. 4b: Transmission electron microscopy diffraction pattern P3 (pearlite condition, 600 °C/16 h)
Fig. 4c: Transmission electron microscopy micrograph, bright field P7 (pearlite condition, 540 °C/96 h)
Fig. 4d: Transmission electron microscopy diffraction pattern P7 (pearlite condition, 540 °C/96 h)
Fig. 5a: Atom probe tomography data as Cameca proprietary raw files P3 (pearlite condition, 600 °C/16 h)
Fig. 5b: Atom probe tomography data as Cameca proprietary raw files P7 (pearlite condition, 540 °C/96 h)
Fig. 7a: Scanning electron microscopy micrograph P3 (short time austenitization and quenching, 770 °C/150 s)
Fig. 7b: Scanning electron microscopy micrograph P7 (short time austenitization and quenching, 770 °C/150 s)
https://publikationen.bibliothek.kit.edu/1000183524
1,1 GB
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