2026-08-03T07:59:10Zhttps://www.radar-service.eu/oai/OAIHandler10.35097/cbx4u9fhfzpdpwds2026-02-10T09:45:07Zradar4kit
10.35097/cbx4u9fhfzpdpwds
Kang, Sangjun
Sangjun
Kang
Institut für Nanotechnologie (INT), Karlsruher Institut für Technologie (KIT)
Cho, Hyeyoung
Hyeyoung
Cho
Institut für Nanotechnologie (INT), Karlsruher Institut für Technologie (KIT)
Töllner, Maximilian
Maximilian
Töllner
Institut für Nanotechnologie (INT), Karlsruher Institut für Technologie (KIT)
Wollersen, Vanessa
Vanessa
Wollersen
Institut für Nanotechnologie (INT), Karlsruher Institut für Technologie (KIT)
Wang, Di
Di
Wang
0000-0001-9817-7047
Kübel, Christian
Christian
Kübel
0000-0001-5701-4006
Validating Electron Pair Distribution Function Analysis: The Role of Multiple Scattering, Beam, Measurement, and Processing Parameters
Karlsruhe Institute of Technology
2024
2025
Engineering
electron pair distribution function
radial distribution function
four-dimensional scanning transmission electron microscopy
STEM-PDF
Open Access
Creative Commons Attribution Non Commercial 4.0 International
Kang, Sangjun
Cho, Hyeyoung
Töllner, Maximilian
Wollersen, Vanessa
Wang, Di
0000-0001-9817-7047
Kübel, Christian
0000-0001-5701-4006
Electron pair distribution function (ePDF), combined with four-dimensional scanning transmission electron microscopy (4D-STEM), provides a powerful approach for uncovering detailed information about the local atomic structure and structural variations in disordered materials. However, achieving high accuracy in ePDF analysis requires careful control of experimental and instrumental parameters. In this study, we systematically investigate the effects of key electron optical and measurement parameters on ePDF analysis using simulations as the primary tool, complemented by experimental validation. Specifically, we examine the influence of diffraction angle range, beam convergence semi-angle, detector pixel resolution, sample thickness (multiple scattering effect), noise, and electron beam precession on the resulting ePDF. By integrating multi-slice electron diffraction simulations with experimental diffraction data, we identify optimal conditions for accurate ePDF extraction and provide practical guidelines to improve analysis precision and reliability. These insights contribute to refining ePDF techniques, particularly for applications involving amorphous and nanostructured materials.
this is data for a journal publication for Ultramicroscopy
https://publikationen.bibliothek.kit.edu/1000188128
211,2 MB
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