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    Datenpaket: Additional data for the dissertation: Resolving locations of defects in superconducting transmon qubits

    Alternativer Identifier:
    (KITopen-DOI) 10.5445/IR/1000097356
    Verwandter Identifier:
    -
    Ersteller/in:
    Bilmes, Alexander [Bilmes, Alexander]
    Beitragende:
    (Other)
    Arbeitsgruppe A. V. Ustinov, Physikalisches Institut, KIT [Arbeitsgruppe A. V. Ustinov, Physikalisches Institut, KIT]
    Titel:
    Additional data for the dissertation: Resolving locations of defects in superconducting transmon qubits
    Weitere Titel:
    -
    Beschreibung:
    (Technical Remarks) Simulation and measurement data used in the dissertation manuscript by Alexander Bilmes(1) "Resolving locations of defects in superconducting transmon qubits" (defense on 8Feb2019, Referent Prof. A.V. Ustinov, Koreferent: Prof. A. Shnirman ), published via KITopen in Aug2018. (1) Physikalisches Institut, KIT, Wolfgang-Gaedestr. 1, 76137 Karlsruhe DOI of this data publication: 10.5445/IR/1000097356 zip files: part1-3: simulation data part4: matlab functions to generate plots contained in the dissertation manuscript after unzipping, you will find the following folders: - Fig2_3: matlab function and data used to generate the figure 2.3 - Fig4_3: matlab function and data used to generate the figure 4.3 - FigD2: matlab function and data used to generate the figure D.2 - TLS-locations\TLS_locations_allQubs_publish.m: matlab function used for the analyzis of TLS locations, and generation of Figures 2.10, 2.11, 4.6-4.8, 4.12-4.14, D.1, E.5, E.6, E.8, F.1 - TLS-locations\errorEstimation_InterfaceParticipation_publish.m: matlab function to estimate the errors presented in Equation 4.7 (Output files Pint_QB2_runAug2018 and Pint_QB2_runAug2018_roughSweep can be plotted with the same function: set the variable "loadprevious" to 1) - E-field_simulations_2D_1 and _2D_2 and _3D: simulation data used in the analyzis above. - E-field_simulations_2D_2\Exported_Data\path_along_film-edge-profile: matlab function to generate the points at the film edge profile (2D model), at which the electric field shall be exported from the simulation model - E-field_simulations_3D\Exported_Data\potential_for_2D-simu_V5_2_10: data exported from the 3D model to find the effective potential for the electrodes in the 2D model (see Fig 4.4 c) - E-field_simulations_3D\Exported_Data\Field_Along_Edges: exported data of electric fields along the fim edge in the 3D model, presented in Figs. 4.6 and F.6
    Schlagworte:
    Superconducting qubit
    transmon
    material defects
    decoherence
    Two-Level-Systems
    TLS
    tunneling defects
    quantum bit
    quantum information
    defect location
    Xmon qubit
    quantum computation
    microwave application
    microwave resonator
    micro fabrication
    Josephson junction
    junction fabrication
    Al/AlOx/Al junction
    EB lithography
    electron-beam lithography
    shadow evaporation
    Dolan-Nienmeyer technique
    tilted-angle deposition
    Zugehörige Informationen:
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    Sprache:
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    Herausgeber/in:
    Karlsruhe Institute of Technology
    Erstellungsjahr:
    Fachgebiet:
    Physics
    Objekttyp:
    Dataset
    Datenquelle:
    -
    Verwendete Software:
    -
    Datenverarbeitung:
    -
    Erscheinungsjahr:
    Rechteinhaber/in:
    Bilmes, Alexander
    Förderung:
    -
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    Status:
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    Eingestellt von:
    kitopen
    Erstellt am:
    Archivierungsdatum:
    2023-06-21
    Archivgröße:
    2,7 GB
    Archiversteller:
    kitopen
    Archiv-Prüfsumme:
    9bf109cf298b44dc8a326dcadeda659f (MD5)
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